
Proceedings Paper
An adaptive calibration circuit for level measurement using optimized ANNFormat | Member Price | Non-Member Price |
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Paper Abstract
Design of an intelligent level measurement technique by Capacitance Level Sensor (CLS) using an Optimized Artificial
Neural Network (OANN) is discussed in this paper. The objectives of the present work are (i) to extend the linearity
range of measurement to 100% of the full scale, (ii) to make the measurement technique adaptive of variation in
permittivity of liquid, liquid temperature, and to achieve objectives (i) and (ii) using an optimized neural network. An
optimized ANN is considered by comparing various algorithms, transfer functions of neuron, and number of hidden
layers based on minimum mean square error (MSE). The output of CLS is capacitance. A data conversion unit is used to
convert it to voltage. A suitable optimized ANN is added, in place of conventional calibration circuit, in cascade to data
conversion unit. The proposed technique provides linear relationship of the overall system over the full input range and makes it adaptive of variation in liquid permittivity and/or temperature. When an unknown level is tested with an
arbitrary liquid permittivity, and temperature, the proposed technique has measured the level correctly. Results show that the proposed scheme has fulfilled the objectives.
Paper Details
Date Published: 28 January 2013
PDF: 10 pages
Proc. SPIE 8760, International Conference on Communication and Electronics System Design, 87600P (28 January 2013); doi: 10.1117/12.2010412
Published in SPIE Proceedings Vol. 8760:
International Conference on Communication and Electronics System Design
Vijay Janyani; M. Salim; K. K. Sharma, Editor(s)
PDF: 10 pages
Proc. SPIE 8760, International Conference on Communication and Electronics System Design, 87600P (28 January 2013); doi: 10.1117/12.2010412
Show Author Affiliations
Santhosh K. V., National Institute of Technology Silchar (India)
B. K. Roy, National Institute of Technology Silchar (India)
Published in SPIE Proceedings Vol. 8760:
International Conference on Communication and Electronics System Design
Vijay Janyani; M. Salim; K. K. Sharma, Editor(s)
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