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Proceedings Paper

Twinning-induced stress and electric field concentrations in ferroelectric ceramics
Author(s): Qing Jiang; Ying Zhang
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Paper Abstract

Experimental investigations suggest that microcracking may be the major cause for the commonly-encountered degradation of ferroelectric actuators, namely electric fatigue. The present analysis, based upon the lattice distortions occurring during the formation of electric twins, indicates that intersections of domain walls with grain boundaries are likely to be origins of microcracks because of the concentrations of stress and electric fields arising due to the incompatibility of the lattice distortions with the grain boundary constraints. This further motivated an asymptotic analysis on the stress and electric field concentrations near intersections of domain walls with grain boundaries. This analysis is carried out within a frame work of electrostatics for deformable continua. Assuming that the electromechanical state in each of the ferroelectric domains is slightly distorted from one of the natural states of the crystal, the authors developed a piecewise linearized model for which concentrations of stress and electric fields correspond to singularities of these fields. The asymptotic analysis concludes that both the stress and electric fields exhibit a power-law singularity. Several examples indicate that the order of singularity depends upon the crystal orientation and the orientations of the domain walls with respect to the grain boundary which they intersect.

Paper Details

Date Published: 2 February 1995
PDF: 16 pages
Proc. SPIE 2427, Active Materials and Smart Structures, (2 February 1995); doi: 10.1117/12.200927
Show Author Affiliations
Qing Jiang, Univ. of Nebraska/Lincoln (United States)
Ying Zhang, Univ. of Nebraska/Lincoln (United States)

Published in SPIE Proceedings Vol. 2427:
Active Materials and Smart Structures
Gary L. Anderson; Dimitris C. Lagoudas, Editor(s)

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