Proceedings Paper
Filter-based interrogation unit for optical wavelength shift sensors| Format | Member Price | Non-Member Price |
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Paper Abstract
We present a filter-based spectrometer consisting of a dielectric thin film filter with a lateral-spectral transmission gradient (linear variable filter) and a position detector which allows high resolution in wavelength shift registration. The resolving capacity of two interrogation unit variants (with segmented and homogeneous position detector, respectively) is examined using a monochromatic tunable light source. On the basis of the obtained results, we discuss several advantages and drawbacks of this interrogation approach.
Paper Details
Date Published: 11 April 2013
PDF: 5 pages
Proc. SPIE 8693, Smart Sensor Phenomena, Technology, Networks, and Systems Integration 2013, 869304 (11 April 2013);
Published in SPIE Proceedings Vol. 8693:
Smart Sensor Phenomena, Technology, Networks, and Systems Integration 2013
Kara J. Peters; Wolfgang Ecke; Theodoros E. Matikas, Editor(s)
PDF: 5 pages
Proc. SPIE 8693, Smart Sensor Phenomena, Technology, Networks, and Systems Integration 2013, 869304 (11 April 2013);
Show Author Affiliations
Roland Wuchrer, Fraunhofer-Institut für Zerstörungsfreie Prüfverfahren (Germany)
Thomas Härtling, Fraunhofer-Institut für Zerstörungsfreie Prüfverfahren (Germany)
Published in SPIE Proceedings Vol. 8693:
Smart Sensor Phenomena, Technology, Networks, and Systems Integration 2013
Kara J. Peters; Wolfgang Ecke; Theodoros E. Matikas, Editor(s)
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