
Proceedings Paper
Tailored spectroscopic and optical properties in rare earth-activated glass-ceramics planar waveguidesFormat | Member Price | Non-Member Price |
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Paper Abstract
Glass ceramic activated by rare earth ions are nanocomposite systems that exhibit specific morphologic, structural and spectroscopic properties allowing to develop interesting new physical concepts, for instance the mechanism related to the transparency, as well as novel photonic devices based on the enhancement of the luminescence. At the state of art the fabrication techniques based on bottom-up and top-down approaches appear to be viable although a specific effort is required to achieve the necessary reliability and reproducibility of the preparation protocols. In particular, the dependence of the final product on the specific parent glass and on the employed synthesis still remain an important task of the research in material science. Glass-ceramic waveguides overcome some of the efficiency problems experienced with conventional waveguides. These two-phase materials are composed of nanocrystals embedded in an amorphous matrix. The respective volume fractions of the crystalline and amorphous phases determine the properties of the glass ceramic. They also represent a valid alternative to widely used glass hosts such as silica as an effective optical medium for light propagation and luminescence enhancement. Looking to application, the enhanced spectroscopic properties typical of glass ceramic in respect to those of the amorphous structures constitute an important point for the development of integrated optics devices, including optical amplifiers, monolithic waveguide laser, novel sensors, coating of spherical microresonators, and up and down converters for solar energy exploitation.
Paper Details
Date Published: 11 March 2013
PDF: 12 pages
Proc. SPIE 8621, Optical Components and Materials X, 86210M (11 March 2013); doi: 10.1117/12.2008192
Published in SPIE Proceedings Vol. 8621:
Optical Components and Materials X
Michel J. F. Digonnet; Shibin Jiang; J. Christopher Dries, Editor(s)
PDF: 12 pages
Proc. SPIE 8621, Optical Components and Materials X, 86210M (11 March 2013); doi: 10.1117/12.2008192
Show Author Affiliations
Davor Ristic, Istituto di Fotonica e Nanotecnologie (Italy)
Thi Thanh Van Tran, Univ. of Sciences (Viet Nam)
Belto Dieudonné, Univ. du Maine (France)
Armellini Cristina, Istituto di Fotonica e Nanotecnologie (Italy)
Simone Berneschi, Museo Storica della Fisica e Ctr. Studi e Ricerche Enrico Fermi (Italy)
Istituto di Fisica Applicata Nello Carrara (Italy)
Andrea Chiappini, Istituto di Fotonica e Nanotecnologie (Italy)
Alessandro Chiasera, Istituto di Fotonica e Nanotecnologie (Italy)
Stefano Varas, Istituto di Fotonica e Nanotecnologie (Italy)
Alessandro Carpentiero, Istituto di Fotonica e Nanotecnologie (Italy)
Maurizio Mazzola, Istituto di Fotonica e Nanotecnologie (Italy)
Gualtiero Nunzi Conti, Istituto di Fisica Applicata Nello Carrara (Italy)
Thi Thanh Van Tran, Univ. of Sciences (Viet Nam)
Belto Dieudonné, Univ. du Maine (France)
Armellini Cristina, Istituto di Fotonica e Nanotecnologie (Italy)
Simone Berneschi, Museo Storica della Fisica e Ctr. Studi e Ricerche Enrico Fermi (Italy)
Istituto di Fisica Applicata Nello Carrara (Italy)
Andrea Chiappini, Istituto di Fotonica e Nanotecnologie (Italy)
Alessandro Chiasera, Istituto di Fotonica e Nanotecnologie (Italy)
Stefano Varas, Istituto di Fotonica e Nanotecnologie (Italy)
Alessandro Carpentiero, Istituto di Fotonica e Nanotecnologie (Italy)
Maurizio Mazzola, Istituto di Fotonica e Nanotecnologie (Italy)
Gualtiero Nunzi Conti, Istituto di Fisica Applicata Nello Carrara (Italy)
Stefano Pelli, Istituto di Fisica Applicata Nello Carrara (Italy)
Giorgio Speranza, Fondazione Bruno Kessler (Italy)
Istituto di Fotonica e Nanotecnologie (Italy)
Patrice Feron, ENSSAT-FOTON, CNRS, Univ. de Rennes 1 (France)
Claire Duverger Arfuso, Univ. du Maine (France)
Gilles Cibiel, Ctr. National d'Études Spatiales (France)
Sylvia Turrell, LASIR, CNRS, CERLA, Univ. Lille 1 (France)
Khiem Tran Ngoc, Hanoi Univ. of Science and Technology (Viet Nam)
Brigitte Boulard, Univ. du Maine (France)
Giancarlo C. Righini, Museo Storica della Fisica e Ctr. Studi e Ricerche Enrico Fermi (Italy)
Istituto di Fisica Applicata Nello Carrara (Italy)
Maurizio Ferrari, Istituto di Fotonica e Nanotecnologie (Italy)
Giorgio Speranza, Fondazione Bruno Kessler (Italy)
Istituto di Fotonica e Nanotecnologie (Italy)
Patrice Feron, ENSSAT-FOTON, CNRS, Univ. de Rennes 1 (France)
Claire Duverger Arfuso, Univ. du Maine (France)
Gilles Cibiel, Ctr. National d'Études Spatiales (France)
Sylvia Turrell, LASIR, CNRS, CERLA, Univ. Lille 1 (France)
Khiem Tran Ngoc, Hanoi Univ. of Science and Technology (Viet Nam)
Brigitte Boulard, Univ. du Maine (France)
Giancarlo C. Righini, Museo Storica della Fisica e Ctr. Studi e Ricerche Enrico Fermi (Italy)
Istituto di Fisica Applicata Nello Carrara (Italy)
Maurizio Ferrari, Istituto di Fotonica e Nanotecnologie (Italy)
Published in SPIE Proceedings Vol. 8621:
Optical Components and Materials X
Michel J. F. Digonnet; Shibin Jiang; J. Christopher Dries, Editor(s)
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