
Proceedings Paper
Impact of thermal oxidation, surface chemistry and porous silicon morphology for sensing applicationsFormat | Member Price | Non-Member Price |
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Paper Abstract
An ideal diagnostic device should be inexpensive, easy-to-use, rapid and reliable. Nanostructured porous silicon (PSi) satisfies these criterions including label-free optical detection and high throughput detection. Pore morphology (size, porosity) must be tailored for each specific application, and for immunosensing applications PSi morphology has been optimized for maximal pore infiltration of larger proteins as immuno gamma globlulin (IgG). Sensor degradation by high salt concentration induces a baseline drift. Different thermal oxidation procedures have been studied in order to obtain a stable sensor in the 3 hour incubation period of the immunoassay with negligible drift
Paper Details
Date Published: 13 March 2013
PDF: 6 pages
Proc. SPIE 8627, Integrated Optics: Devices, Materials, and Technologies XVII, 86271E (13 March 2013); doi: 10.1117/12.2007377
Published in SPIE Proceedings Vol. 8627:
Integrated Optics: Devices, Materials, and Technologies XVII
Jean Emmanuel Broquin; Gualtiero Nunzi Conti, Editor(s)
PDF: 6 pages
Proc. SPIE 8627, Integrated Optics: Devices, Materials, and Technologies XVII, 86271E (13 March 2013); doi: 10.1117/12.2007377
Show Author Affiliations
I. A. Kolmychek, Lomonosov Moscow State Univ. (Russian Federation)
D. A. Kopylov, Lomonosov Moscow State Univ. (Russian Federation)
T. V. Murzina, Lomonosov Moscow State Univ. (Russian Federation)
F. Baldini, Istituto di Fisica Applicata Nello Carrara (Italy)
S. Berneschi, Istituto di Fisica Applicata Nello Carrara (Italy)
D. A. Kopylov, Lomonosov Moscow State Univ. (Russian Federation)
T. V. Murzina, Lomonosov Moscow State Univ. (Russian Federation)
F. Baldini, Istituto di Fisica Applicata Nello Carrara (Italy)
S. Berneschi, Istituto di Fisica Applicata Nello Carrara (Italy)
D. Farnesi, Istituto di Fisica Applicata Nello Carrara (Italy)
Museo Storica della Fisica e Ctr. Studi e Ricerche Enrico Fermi (Italy)
A. Giannetti, Istituto di Fisica Applicata Nello Carrara (Italy)
S. Tombelli, Istituto di Fisica Applicata Nello Carrara (Italy)
G. Nunzi Conti, Istituto di Fisica Applicata Nello Carrara (Italy)
S. Soria, Istituto di Fisica Applicata Nello Carrara (Italy)
Museo Storica della Fisica e Ctr. Studi e Ricerche Enrico Fermi (Italy)
A. Giannetti, Istituto di Fisica Applicata Nello Carrara (Italy)
S. Tombelli, Istituto di Fisica Applicata Nello Carrara (Italy)
G. Nunzi Conti, Istituto di Fisica Applicata Nello Carrara (Italy)
S. Soria, Istituto di Fisica Applicata Nello Carrara (Italy)
Published in SPIE Proceedings Vol. 8627:
Integrated Optics: Devices, Materials, and Technologies XVII
Jean Emmanuel Broquin; Gualtiero Nunzi Conti, Editor(s)
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