
Proceedings Paper
Reconstruction method incorporating the object-position dependence of visibility loss in dark-field imagingFormat | Member Price | Non-Member Price |
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Paper Abstract
Dark-field imaging has the potential to overcome limitations in computed tomography (CT) investigating relatively
weakly absorbing material. However, an object-position dependence of the visibility loss in dark-field
imaging is observed. This effect might be negligible for small objects, but, for acquisition geometries using fanangle
apertures and field of views as those in human CT scanners, the object-position dependence of visibility
loss has to be taken into consideration if the scattering structure within the object is in the range of the grating
periods, i.e. micrometer. This work examines the effect of object-position dependent visibility loss in dark-field
imaging experimentally, investigates its consequences and presents an algorithm which solves the corresponding
reconstruction problem.
Paper Details
Date Published: 6 March 2013
PDF: 11 pages
Proc. SPIE 8668, Medical Imaging 2013: Physics of Medical Imaging, 86680Z (6 March 2013); doi: 10.1117/12.2006711
Published in SPIE Proceedings Vol. 8668:
Medical Imaging 2013: Physics of Medical Imaging
Robert M. Nishikawa; Bruce R. Whiting; Christoph Hoeschen, Editor(s)
PDF: 11 pages
Proc. SPIE 8668, Medical Imaging 2013: Physics of Medical Imaging, 86680Z (6 March 2013); doi: 10.1117/12.2006711
Show Author Affiliations
Udo van Stevendaal, Philips Research Labs. (Germany)
Zhentian Wang, Swiss Light Source, Paul Scherrer Institut (Switzerland)
Thomas Köhler, Philips Research Labs. (Germany)
Zhentian Wang, Swiss Light Source, Paul Scherrer Institut (Switzerland)
Thomas Köhler, Philips Research Labs. (Germany)
Gerhard Martens, Philips Research Labs. (Germany)
Marco Stampanoni, Swiss Light Source, Paul Scherrer Institut (Switzerland)
Institute for Biomedical Engineering, Univ. and ETH Zurich (Switzerland)
Ewald Roessl, Philips Research Labs. (Germany)
Marco Stampanoni, Swiss Light Source, Paul Scherrer Institut (Switzerland)
Institute for Biomedical Engineering, Univ. and ETH Zurich (Switzerland)
Ewald Roessl, Philips Research Labs. (Germany)
Published in SPIE Proceedings Vol. 8668:
Medical Imaging 2013: Physics of Medical Imaging
Robert M. Nishikawa; Bruce R. Whiting; Christoph Hoeschen, Editor(s)
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