The multi-resolution technology was developed for dynamic flat panel detectors for X-ray imaging. This multi-resolution technology allows us to switch between the 1 x 1 mode (150 μm square) and the 2 x 2 mode (300 μm square) instantaneously, using an external control. We developed a 17" x 17" dynamic detector using this multi-resolution technology. This novel dynamic detector has a high sensitivity and a high-speed readout and it can reduce the radiation exposure dose and deliver a smooth image. The key feature of our multi-resolution technology is capable of reading 4 pixel signals simultaneously. The sensitivity and the readout speed in the 2 x 2 mode were 4 times higher than those in the 1 x 1 mode. The multi-resolution technology was implemented using a unique thin film transistor structure; that is, one pixel has two switches, each of which are turned on/off depending on the readout mode. As a result, the dynamic detector with a large active area of 17" x 17" realized a high detective quantum efficiency value of 40% under the low radiation of RQA5 20 nGy and a high-speed readout of 30 frames/sec. This multi-resolution technology made it possible to reduce the radiation exposure dose in a variety of applications.

Date Published: 6 March 2013
PDF: 7 pages
Proc. SPIE 8668, Medical Imaging 2013: Physics of Medical Imaging, 866807 (6 March 2013); doi: 10.1117/12.2006528

Published in SPIE Proceedings Vol. 8668:
Medical Imaging 2013: Physics of Medical Imaging
Robert M. Nishikawa; Bruce R. Whiting; Christoph Hoeschen, Editor(s)