A better understanding of structural properties and growth kinetics of Stranski-Krastanov (SK) quantum dots is necessary for applying dot potential in optical and electronic applications. In fact, We have recently demonstrated theoretically and experimentally, the ability of reflection high energy electron diffraction (RHEED) tool in quantitative analysis such as extracting average dot size, facet orientation and average dot density and real time monitoring of dot size during growth .As an extended study, in this work for the first time we present the experimental evidence on onset epitaxial quantum dot average shape evolution and theoretical predictions on QD facet orientations.

Date Published: 29 March 2013
PDF: 7 pages
Proc. SPIE 8634, Quantum Dots and Nanostructures: Synthesis, Characterization, and Modeling X, 86340R (29 March 2013); doi: 10.1117/12.2005283

Published in SPIE Proceedings Vol. 8634:
Quantum Dots and Nanostructures: Synthesis, Characterization, and Modeling X
Kurt G. Eyink; Diana L. Huffaker; Frank Szmulowicz, Editor(s)