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Proceedings Paper

Characterization of a MEMS deformable mirror by far field intensity evaluation
Author(s): Cherry Greiner; Susanna Finn; Stacey Choi; Nathan Doble
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Paper Abstract

The performance of an adaptive optics (AO) system is typically measured using the wavefront sensor (WFS). However, another method is to use the point spread function (PSF), which is sensitive to scatter, does not act as a low pass filter and is not dependent on the WFS calibration. We decided to examine the performance of an AO system built for vision science that employed a micromechanical systems (MEMS) based deformable mirror (DM). Specifically, the MEMS DM consists of 489 actuators, resulting in 163 segments each with individual piston/tip/tilt control. Initial evaluation of the DM with a model eye included determining the ability of the DM to generate individual Zernike polynomials and evaluating the far field PSF to measure wavefront correction performance. For individual Zernike polynomial terms, the DM was found to be capable of correcting the aberration magnitudes expected from previously published human population studies.1, 2 Finally, the DM was used in an AO fundus camera to successfully acquire images of cone photoreceptors in a living human eye. This is part of ongoing work which will incorporate the MEMS DM into both an AO scanning laser ophthalmoscope (SLO) and an AO optical coherence tomography (OCT) system where the form of the PSF at the confocal pinhole/optical fiber is important for optimal imaging.

Paper Details

Date Published: 5 March 2013
PDF: 10 pages
Proc. SPIE 8617, MEMS Adaptive Optics VII, 86170J (5 March 2013); doi: 10.1117/12.2004936
Show Author Affiliations
Cherry Greiner, New England College of Optometry (United States)
Susanna Finn, New England College of Optometry (United States)
Stacey Choi, New England College of Optometry (United States)
Nathan Doble, New England College of Optometry (United States)

Published in SPIE Proceedings Vol. 8617:
MEMS Adaptive Optics VII
Scot S. Olivier; Thomas G. Bifano; Joel Kubby, Editor(s)

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