
Proceedings Paper
Bayesian estimation of device spectral sensitivities and its application for improvement of color accuracy using color balancing filterFormat | Member Price | Non-Member Price |
---|---|---|
$17.00 | $21.00 |
Paper Abstract
We proposed a Bayesian method for estimating the system spectral sensitivities of a color imaging device such
as a scanner and a camera from an acquired color chart image. The system sensitivities are defined by the
product of spectral sensitivities of camera and spectral power distribution of illuminant, and characterize color
separation. In addition we proposed a scheme for predicting the optimal filter to increase color accuracy of
the device based on the estimated sensitivities. The predicted filter is attached to the front of camera and
modifies the system spectral sensitivities. This study aimed to improve color reproduction of the imaging
device in practical way even if the spectral sensitivities of the device are unknown. The proposed method is
derived by introducing the non-negativity, the smoothness and the zero boundaries of the sensitivity curves as
prior information. All hyperparameters in the proposed Bayesian model can be determined automatically by
the marginalized likelihood criterion. The modified system sensitivities and their color accuracy are predicted
computationally. An experiment was carried out to test the performance of the proposed method for predicting
the color accuracy improvement using two scanners. The average color difference was reduced from 3.07 to 2.04
and from 2.11 to 1.77 in the two scanners.
Paper Details
Date Published: 4 February 2013
PDF: 6 pages
Proc. SPIE 8660, Digital Photography IX, 86600Q (4 February 2013); doi: 10.1117/12.2003595
Published in SPIE Proceedings Vol. 8660:
Digital Photography IX
Nitin Sampat; Sebastiano Battiato, Editor(s)
PDF: 6 pages
Proc. SPIE 8660, Digital Photography IX, 86600Q (4 February 2013); doi: 10.1117/12.2003595
Show Author Affiliations
Published in SPIE Proceedings Vol. 8660:
Digital Photography IX
Nitin Sampat; Sebastiano Battiato, Editor(s)
© SPIE. Terms of Use
