Share Email Print
cover

Proceedings Paper

On the wavelength dependence of femtosecond laser interactions inside band gap solids
Author(s): S. Leyder; D. Grojo; Ph. Delaporte; M. Lebugle; W. Marine; N. Sanner; M. Sentis; O. Utéza
Format Member Price Non-Member Price
PDF $17.00 $21.00

Paper Abstract

3D laser microfabrication inside narrow band gap solids like semiconductors will require the use of long wavelength intense pulses. We perform an experimental study of the multiphoton-avalanche absorption yields and thresholds with tightly focused femtosecond laser beams at wavelengths: 1.3μm and 2.2μm. For comparisons, we perform the experiments in two very different materials: silicon (semiconductor, ∼1.1 eV indirect bandgap) and fused silica (dielectric, ∼9 eV direct bandgap). For both materials, we find only moderate differences while the number of photons required to cross the band gap changes from 2 to 3 in silicon and from 10 to 16 in fused silica.

Paper Details

Date Published: 15 March 2013
PDF: 7 pages
Proc. SPIE 8611, Frontiers in Ultrafast Optics: Biomedical, Scientific, and Industrial Applications XIII, 861113 (15 March 2013); doi: 10.1117/12.2003545
Show Author Affiliations
S. Leyder, Lab. Lasers, Plasmas et Procédés Photoniques, CNRS, Aix-Marseille Univ. (France)
D. Grojo, Lab. Lasers, Plasmas et Procédés Photoniques, CNRS, Aix-Marseille Univ. (France)
Ph. Delaporte, Lab. Lasers, Plasmas et Procédés Photoniques, CNRS, Aix-Marseille Univ. (France)
M. Lebugle, Lab. Lasers, Plasmas et Procédés Photoniques, CNRS, Aix-Marseille Univ. (France)
W. Marine, CINAM, CNRS, Aix-Marseille Univ. (France)
N. Sanner, Lab. Lasers, Plasmas et Procédés Photoniques, CNRS, Aix-Marseille Univ. (France)
M. Sentis, Lab. Lasers, Plasmas et Procédés Photoniques, CNRS, Aix-Marseille Univ. (France)
O. Utéza, Lab. Lasers, Plasmas et Procédés Photoniques, CNRS, Aix-Marseille Univ. (France)


Published in SPIE Proceedings Vol. 8611:
Frontiers in Ultrafast Optics: Biomedical, Scientific, and Industrial Applications XIII
Alexander Heisterkamp; Peter R. Herman; Michel Meunier; Stefan Nolte, Editor(s)

© SPIE. Terms of Use
Back to Top
PREMIUM CONTENT
Sign in to read the full article
Create a free SPIE account to get access to
premium articles and original research
Forgot your username?
close_icon_gray