
Proceedings Paper
The coherent artifact in modern pulse measurementFormat | Member Price | Non-Member Price |
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Paper Abstract
We study multi-shot intensity-and-phase measurements of unstable trains of ultrashort pulses using spectral-phase interferometry for direct electric-field reconstruction (SPIDER), second harmonic generation (SHG) frequency-resolved optical gating (FROG), polarization gate (PG) FROG, and cross-correlation FROG (XFROG). An analytical calculation suggests that SPIDER cannot indicate instability in pulse trains well. Simulations confirm this and demonstrate that SPIDER only measures the coherent artifact. Further, the presence of instability cannot be distinguised from benign misalignment effects in SPIDER. FROG methods suggest instability by exhibiting clear disagreement between measured and retrieved traces.
Paper Details
Date Published: 15 March 2013
PDF: 8 pages
Proc. SPIE 8611, Frontiers in Ultrafast Optics: Biomedical, Scientific, and Industrial Applications XIII, 86110R (15 March 2013); doi: 10.1117/12.2003302
Published in SPIE Proceedings Vol. 8611:
Frontiers in Ultrafast Optics: Biomedical, Scientific, and Industrial Applications XIII
Alexander Heisterkamp; Peter R. Herman; Michel Meunier; Stefan Nolte, Editor(s)
PDF: 8 pages
Proc. SPIE 8611, Frontiers in Ultrafast Optics: Biomedical, Scientific, and Industrial Applications XIII, 86110R (15 March 2013); doi: 10.1117/12.2003302
Show Author Affiliations
Michelle Rhodes, Georgia Institute of Technology (United States)
Günter Steinmeyer, Max-Born-Institut für Nichtlineare Optik und Kurzzeitspektroskopie (Germany)
Günter Steinmeyer, Max-Born-Institut für Nichtlineare Optik und Kurzzeitspektroskopie (Germany)
Justin Ratner, Georgia Institute of Technology (United States)
Rick Trebino, Georgia Institute of Technology (United States)
Rick Trebino, Georgia Institute of Technology (United States)
Published in SPIE Proceedings Vol. 8611:
Frontiers in Ultrafast Optics: Biomedical, Scientific, and Industrial Applications XIII
Alexander Heisterkamp; Peter R. Herman; Michel Meunier; Stefan Nolte, Editor(s)
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