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Proceedings Paper

Mapping the absolute electromagnetic field strength of individual field components inside a photonic crystal
Author(s): T. Denis; B. Reijnders; J. H. H. Lee; W. L Vos; K.-J. Boller; P. J. M. van der Slot
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Paper Abstract

We present a method to map the absolute electromagnetic field strength inside photonic crystals. We demonstrate our method by applying it to map the electric field component Ez of a two-dimensional photonic crystal slab at microwave frequencies. The slab is placed between two mirrors to create a resonator and a subwavelength spherical scatterer is scanned inside the resonator. The resonant Bloch frequencies shift depending on the electric field at the scatterer position. By measuring the frequency shift in the reflection and transmission spectrum versus the scatterer position we determine the field strength. Excellent agreement is found between measurements and calculations without any adjustable parameters and a possible realization is suggested for measurements at optical frequencies.

Paper Details

Date Published: 21 February 2013
PDF: 9 pages
Proc. SPIE 8632, Photonic and Phononic Properties of Engineered Nanostructures III, 863211 (21 February 2013); doi: 10.1117/12.2002945
Show Author Affiliations
T. Denis, Univ. Twente (Netherlands)
B. Reijnders, Univ. Twente (Netherlands)
J. H. H. Lee, Univ. Twente (Netherlands)
W. L Vos, Univ. Twente (Netherlands)
K.-J. Boller, Univ. Twente (Netherlands)
P. J. M. van der Slot, Univ. Twente (Netherlands)

Published in SPIE Proceedings Vol. 8632:
Photonic and Phononic Properties of Engineered Nanostructures III
Ali Adibi; Shawn-Yu Lin; Axel Scherer, Editor(s)

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