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Proceedings Paper

The range of VCSEL wearout reliability acceleration behavior and its effects on applications
Author(s): James Guenter; Luke Graham; Bobby Hawkins; Robert Hawthorne; Ralph Johnson; Gary Landry; Jim Tatum
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Paper Abstract

For nearly twenty years most models of VCSEL wearout reliability have incorporated Arrhenius activation energy near 0.7 eV, usually with a modest current exponent in addition. As VCSEL production extends into more wavelength, power, and speed regimes new active regions, mirror designs, and growth conditions have become necessary. Even at more traditional VCSEL 850-nm wavelengths instances of very different reliability acceleration factors have arisen. In some cases these have profound effects on the expected reliability under normal use conditions, resulting in wearout lifetimes that can vary more than an order of magnitude. These differences enable the extension of VCSELs in communications applications to even greater speeds with reliability equal to or even greater than the previous lowerspeed devices. This paper discusses some of the new applications, different wearout behaviors, and their implications in real-life operation. The effect of different acceleration behaviors on reliability testing is also addressed.

Paper Details

Date Published: 13 March 2013
PDF: 8 pages
Proc. SPIE 8639, Vertical-Cavity Surface-Emitting Lasers XVII, 86390I (13 March 2013); doi: 10.1117/12.2002840
Show Author Affiliations
James Guenter, Finisar Corp. (United States)
Luke Graham, Finisar Corp. (United States)
Bobby Hawkins, Finisar Corp. (United States)
Robert Hawthorne, Finisar Corp. (United States)
Ralph Johnson, Finisar Corp. (United States)
Gary Landry, Finisar Corp. (United States)
Jim Tatum, Finisar Corp. (United States)

Published in SPIE Proceedings Vol. 8639:
Vertical-Cavity Surface-Emitting Lasers XVII
Kent D. Choquette; James K. Guenter, Editor(s)

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