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Proceedings Paper

Metastable eutectics in multilayers
Author(s): L. S. Palatnik; Anatoli I. Fedorenko
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Paper Abstract

The effect of phase equilibrium at multilayer interfaces on melting temperature of multilayer x-ray mirrors is reported. Based on phase equilibrium diagram of alloys, approach to an estimation of melting temperature and component concentrations of metastable eutectics is suggested. Application of this approach to metastable Mo-Si and W-Si multilayer x-ray mirrors revealed that phase nonequilibrium can decrease substantially the multilayer melting temperature (by approximately equals 200 degree(s)C in case of metastable Mo-Si eutectic in comparison with the most light-melted stable MoSi2-Si eutectic in the whole Mo-Si system).

Paper Details

Date Published: 23 January 1995
PDF: 3 pages
Proc. SPIE 2453, X-Ray Optics and Surface Science, (23 January 1995); doi: 10.1117/12.200279
Show Author Affiliations
L. S. Palatnik, Kharkov Polytechnical Institute (Ukraine)
Anatoli I. Fedorenko, Kharkov Polytechnical Institute (Ukraine)

Published in SPIE Proceedings Vol. 2453:
X-Ray Optics and Surface Science
Alexander V. Vinogradov, Editor(s)

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