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Proceedings Paper

Effects of near-surface transition layer on x-ray reflection and scattering
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Paper Abstract

The influence of smooth (not step-like) variation of the dielectric function near a surface on reflectivity and scattering of X-rays is investigated theoretically. It is shown than the presence of the transition layer can essentially change the shape of differential scattering intensity diagram, especially when the incidence angle of X- ray beam is more than critical angle of the total external reflection. The application of model involved allows one to describe the Yoneda effect quantitatively (whereas it is impossible in the frames of a step- like model of the dielectric function).

Paper Details

Date Published: 23 January 1995
PDF: 22 pages
Proc. SPIE 2453, X-Ray Optics and Surface Science, (23 January 1995); doi: 10.1117/12.200272
Show Author Affiliations
Igor A. Artioukov, P.N. Lebedev Physical Institute (Russia)
Igor V. Kozhevnikov, P.N. Lebedev Physical Institute (Russia)

Published in SPIE Proceedings Vol. 2453:
X-Ray Optics and Surface Science
Alexander V. Vinogradov, Editor(s)

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