
Proceedings Paper
Development of a computer-aided alignment simulator for an EO/IR dual-band airborne cameraFormat | Member Price | Non-Member Price |
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Paper Abstract
An airborne sensor is developed for remote sensing on an unmanned aerial vehicle (UAV). The sensor is an optical
payload for an eletro-optical/infrared (EO/IR) dual band camera that combines visible and IR imaging capabilities in a
compact and lightweight manner. It adopts a Ritchey-Chrétien telescope for the common front end optics with several
relay optics that divide and deliver EO and IR bands to a charge-coupled-device (CCD) and an IR detector, respectively.
For the easy assemble of such a complicated optics, a computer-aided alignment program (herein called simulator) is
developed. The simulator first estimates the details of the misalignments such as locations, types, and amounts from the
test results such as modulation transfer function (MTF), Zernike polynomial coefficients, and RMS wavefront errors at
different field positions. Then it recommends the compensator movement(s) with the estimated optical performance. The
simulator is coded on Matlab with the hidden connection to optical analysis/design software Zemax. By interfacing
ZEMAX and MATLAB, the GUI-based alignment simulator, will help even those not familiar with the two programs to
obtain accurate results more easily and quickly.
Paper Details
Date Published: 15 October 2012
PDF: 7 pages
Proc. SPIE 8417, 6th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment, 84170E (15 October 2012); doi: 10.1117/12.2002562
Published in SPIE Proceedings Vol. 8417:
6th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment
Yudong Zhang; Libin Xiang; Sandy To, Editor(s)
PDF: 7 pages
Proc. SPIE 8417, 6th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment, 84170E (15 October 2012); doi: 10.1117/12.2002562
Show Author Affiliations
Jun Ho Lee, Kongju National Univ. (Korea, Republic of)
Seungyeol Ryoo, Kongju National Univ. (Korea, Republic of)
Seungyeol Ryoo, Kongju National Univ. (Korea, Republic of)
Kwang-Woo Park, Agency for Defense Development (Korea, Republic of)
Haeng Bok Lee, Agency for Defense Development (Korea, Republic of)
Haeng Bok Lee, Agency for Defense Development (Korea, Republic of)
Published in SPIE Proceedings Vol. 8417:
6th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment
Yudong Zhang; Libin Xiang; Sandy To, Editor(s)
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