
Proceedings Paper
Study on stress birefringence measurement of uni-axial crystalFormat | Member Price | Non-Member Price |
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Paper Abstract
Residual stress birefringence in crystal will affect frequency conversion efficiency and beam quality. In this paper the
distribution characteristics of inherent stress birefringence in crystal is analyzed, through delicate adjustment the optical
axis is oriented and qualitative results obtained for KDP crystals are presented and discussed by imaging digital stress
measurement instrument, and the stress gradient distribution is calculated, also the effect of deviation from optical axis
on the measured stress distribution results is discussed.
Paper Details
Date Published: 15 October 2012
PDF: 5 pages
Proc. SPIE 8417, 6th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment, 84172R (15 October 2012); doi: 10.1117/12.2002560
Published in SPIE Proceedings Vol. 8417:
6th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment
Yudong Zhang; Libin Xiang; Sandy To, Editor(s)
PDF: 5 pages
Proc. SPIE 8417, 6th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment, 84172R (15 October 2012); doi: 10.1117/12.2002560
Show Author Affiliations
Xiaohong Wei, Chengdu Fine Optical Engineering Research Ctr. (China)
Liqun Chai, Chengdu Fine Optical Engineering Research Ctr. (China)
Liqun Chai, Chengdu Fine Optical Engineering Research Ctr. (China)
Qiang Li, Chengdu Fine Optical Engineering Research Ctr. (China)
Bo Gao, Chengdu Fine Optical Engineering Research Ctr. (China)
Bo Gao, Chengdu Fine Optical Engineering Research Ctr. (China)
Published in SPIE Proceedings Vol. 8417:
6th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment
Yudong Zhang; Libin Xiang; Sandy To, Editor(s)
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