
Proceedings Paper
Demosaicing for RGBZ sensorFormat | Member Price | Non-Member Price |
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Paper Abstract
In this paper, we proposed a new technique for demosaicing a unique RGBZ color-depth imaging sensor, which
captures color and depth images simultaneously, with a specially designed color-filter-array (CFA) where two out of
six RGB color rows are replaced by “Z” pixels that capture depth information but no color information. Therefore,
in an RGBZ image, the red, green and blue colors are more sparsely sampled than in a standard Bayer image. Due to
the missing rows in the data image, commonly used demosaicing algorithms for the standard Bayer CFA cannot be
applied directly. To this end, our method first fills-in the missing rows to reconstruct a full Bayer CFA, followed by
a color-selective adaptive demosaicing algorithm that interpolates missing color components. In the first step, unlike
common bilinear interpolation approaches that tend to blur edges, our edge-based directional interpolation approach,
derived from de-interlacing techniques, emphasizes reconstructing more straight and sharp edges with fewer
artifacts and thereby preserves the vertical resolution in the reconstructed the image. In the second step, to avoid
using the newly estimated pixels for demosaicing, the bilateral-filter-based approach interpolates the missing color
samples based on weighted average of adaptively selected known pixels from the local neighborhoods. Tests show
that the proposed method reconstructs full color images while preserving edges details, avoiding artifacts, and
removing noise with high efficiency.
Paper Details
Date Published: 14 February 2013
PDF: 9 pages
Proc. SPIE 8657, Computational Imaging XI, 865705 (14 February 2013); doi: 10.1117/12.2001702
Published in SPIE Proceedings Vol. 8657:
Computational Imaging XI
Charles A. Bouman; Ilya Pollak; Patrick J. Wolfe, Editor(s)
PDF: 9 pages
Proc. SPIE 8657, Computational Imaging XI, 865705 (14 February 2013); doi: 10.1117/12.2001702
Show Author Affiliations
Lilong Shi, Samsung Semiconductor Inc. (United States)
Ilia Ovsiannikov, Samsung Semiconductor Inc. (United States)
Dong-Ki Min, Semiconductor R&D Ctr. (Korea, Republic of)
Yohwan Noh, Semiconductor R&D Ctr. (Korea, Republic of)
Wanghyun Kim, Semiconductor R&D Ctr. (Korea, Republic of)
Sunhwa Jung, Semiconductor R&D Ctr. (Korea, Republic of)
Joonho Lee, Semiconductor R&D Ctr. (Korea, Republic of)
Ilia Ovsiannikov, Samsung Semiconductor Inc. (United States)
Dong-Ki Min, Semiconductor R&D Ctr. (Korea, Republic of)
Yohwan Noh, Semiconductor R&D Ctr. (Korea, Republic of)
Wanghyun Kim, Semiconductor R&D Ctr. (Korea, Republic of)
Sunhwa Jung, Semiconductor R&D Ctr. (Korea, Republic of)
Joonho Lee, Semiconductor R&D Ctr. (Korea, Republic of)
Deokha Shin, Semiconductor R&D Ctr. (Korea, Republic of)
Hyekyung Jung, Semiconductor R&D Ctr. (Korea, Republic of)
Gregory Waligorski, Samsung Semiconductor Inc. (United States)
Yibing Michelle Wang, Samsung Semiconductor Inc. (United States)
Wendy Wang, Samsung Semiconductor Inc. (United States)
Yoondong Park, Semiconductor R&D Ctr. (Korea, Republic of)
Chilhee Chung, Semiconductor R&D Ctr. (Korea, Republic of)
Hyekyung Jung, Semiconductor R&D Ctr. (Korea, Republic of)
Gregory Waligorski, Samsung Semiconductor Inc. (United States)
Yibing Michelle Wang, Samsung Semiconductor Inc. (United States)
Wendy Wang, Samsung Semiconductor Inc. (United States)
Yoondong Park, Semiconductor R&D Ctr. (Korea, Republic of)
Chilhee Chung, Semiconductor R&D Ctr. (Korea, Republic of)
Published in SPIE Proceedings Vol. 8657:
Computational Imaging XI
Charles A. Bouman; Ilya Pollak; Patrick J. Wolfe, Editor(s)
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