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Proceedings Paper

1.55µm laterally coupled ridge-waveguide DFB lasers with third-order surface grating
Author(s): Kais Dridi; Abdessamad Benhsaien; Jessica Zhang; Trevor Hall
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Paper Abstract

Laterally-coupled distributed feedback (LC-DFB) lasers offer compelling advantages over standard DFB lasers. The use of surface grating on the ridge waveguide sidewalls in LC-DFB devices avoids any epitaxial overgrowth. This provides a considerable simplification in the fabrication process, reducing cost and time of manufacturing, and ultimately increasing yield. It offers also the potential for monolithic integration with other devices; paving the way towards low-cost and mass-production of photonics integrated circuits. In this work, we report on the realization of high-order grating InGaAsP/InP multiple-quantum-well (MQW) LC-DFB lasers at 1.55 μm by means of stepper lithography and inductively-coupled reactive-ion as well as wet chemical etching. Third-order rectangular-shaped grating has been lithographically defined on the ridge waveguide sidewalls with a relatively deep etching along the laser cavity. The preliminary experimental characterization shows interesting results for as-cleaved devices tested in room temperature under CW operation. A fabricated 1500 μm-long cavity LC-DFB laser shows stable single-mode operation with a side mode suppression ratio as high as 50 dB. The tested device can emit at power as high as 9 mW, and the measured threshold current is around 80 mA at room temperature. Moreover, the measured linewidth has been found to be as narrow as 178 kHz using the delayed self-heterodyne interferometric technique.

Paper Details

Date Published: 24 October 2012
PDF: 6 pages
Proc. SPIE 8412, Photonics North 2012, 84121R (24 October 2012); doi: 10.1117/12.2001459
Show Author Affiliations
Kais Dridi, Univ. of Ottawa (Canada)
Abdessamad Benhsaien, Univ. of Ottawa (Canada)
Jessica Zhang, CMC Microsystems (Canada)
Trevor Hall, Univ. of Ottawa (Canada)

Published in SPIE Proceedings Vol. 8412:
Photonics North 2012
Jean-Claude Kieffer, Editor(s)

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