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Proceedings Paper

A single lens with no moving parts for rapid high-resolution 3D image capture
Author(s): Dan Gray; Hongquiang Chen; Joseph Czechowski; Kang Zhang; Jilin Tu; Frederick Wheeler; Masako Yamada; Juan Pablo Cilia; Russell DeMuth; Esmaeil Heidari; Gil Abramovich; Kevin Harding
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Paper Abstract

There are many visual inspection and sensing applications where both a high resolution image and a depth-map of the imaged object are desirable at high speed. Presently available methods to capture 3D data (stereo cameras and structured illumination), are limited in speed, complexity, and transverse resolution. Additionally these techniques rely on a separated baseline for triangulation, precluding use in confined spaces. Typically, off the shelf lenses are implemented where performance in resolution, field-of-view, and depth of field are sacrificed in order to achieve a useful balance. Here we present a novel lens system with high-resolution and wide field-of-view for rapid 3D image capture. The design achieves this using a single lens with no moving parts. A depth-from-defocus algorithm is implemented to reconstruct 3D object point clouds and matched with a fused image to create a 3D rendered view.

Paper Details

Date Published: 19 February 2013
PDF: 11 pages
Proc. SPIE 8659, Sensors, Cameras, and Systems for Industrial and Scientific Applications XIV, 86590N (19 February 2013); doi: 10.1117/12.2001449
Show Author Affiliations
Dan Gray, GE Global Research (United States)
Hongquiang Chen, GE Global Research (United States)
Joseph Czechowski, GE Global Research (United States)
Kang Zhang, GE Global Research (United States)
Jilin Tu, GE Global Research (United States)
Frederick Wheeler, GE Global Research (United States)
Masako Yamada, GE Global Research (United States)
Juan Pablo Cilia, GE Global Research (United States)
Russell DeMuth, GE Global Research (United States)
Esmaeil Heidari, GE Global Research (United States)
Gil Abramovich, GE Global Research (United States)
Kevin Harding, GE Global Research (United States)


Published in SPIE Proceedings Vol. 8659:
Sensors, Cameras, and Systems for Industrial and Scientific Applications XIV
Ralf Widenhorn; Antoine Dupret, Editor(s)

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