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Proceedings Paper

Quantitative phase analysis through scattering media by depth-filtered digital holography
Author(s): Sebastian Goebel; Volker Jaedicke; Nektarios Koukourakis; Helge Wiethoff; Adamou Adinda-Ougba; Nils C. Gerhardt; Hubert Welp; Martin R. Hofmann
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Paper Abstract

Digital holography (DH) is capable of providing three-dimensional topological surface profiles with axial resolutions in the nanometer range. To achieve such high resolutions requires an analysis of the phase information of the reflected light by means of numerical reconstruction methods. Unfortunately, the phase analysis of structures located in scattering media is usually disturbed by interference with reflected light from different depths. In contrast, low-coherence interferometry and optical coherence tomography (OCT) use broadband light sources to investigate the sample with a coherence gate providing tomographic measurements in scattering samples with a poorer depth-resolution of a few micrometers. We propose a new approach that allows recovering the phase information even through scattering media. The approach combines both techniques by creating synthesized interference patterns from scanned spectra. After applying an inverse Fourier transform to each spectrum, we yield three-dimensional depth-resolved images. Subsequently, contributions of photons scattered from unwanted regions are suppressed by depth-filtering. The back-transformed data can be considered as multiple synthesized holograms and the corresponding phase information can be extracted directly from the depthfiltered spectra. We used this approach to record and reconstruct holograms of a reflective surface through a scattering layer. Our results demonstrate a proof-of-principle, as the quantitative phase-profile could be recovered and effectively separated from scattering influences. Moreover, additional processing steps could pave the way to further applications, i.e. spectroscopic analysis.

Paper Details

Date Published: 22 February 2013
PDF: 8 pages
Proc. SPIE 8589, Three-Dimensional and Multidimensional Microscopy: Image Acquisition and Processing XX, 85891J (22 February 2013); doi: 10.1117/12.2001159
Show Author Affiliations
Sebastian Goebel, Georg Agricola Univ. of Applied Sciences (Germany)
Volker Jaedicke, Ruhr-Univ. Bochum (Germany)
Nektarios Koukourakis, Ruhr-Univ. Bochum (Germany)
Helge Wiethoff, Ruhr-Univ. Bochum (Germany)
Adamou Adinda-Ougba, Ruhr-Univ. Bochum (Germany)
Nils C. Gerhardt, Ruhr-Univ. Bochum (Germany)
Hubert Welp, Georg Agricola Univ. of Applied Sciences (Germany)
Martin R. Hofmann, Ruhr-Univ. Bochum (Germany)

Published in SPIE Proceedings Vol. 8589:
Three-Dimensional and Multidimensional Microscopy: Image Acquisition and Processing XX
Carol J. Cogswell; Thomas G. Brown; Jose-Angel Conchello; Tony Wilson, Editor(s)

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