
Proceedings Paper
Quantum cascade laser-based sensing to investigate fast laser ablation processFormat | Member Price | Non-Member Price |
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Paper Abstract
We demonstrated a sensing technique for in-line ablation rate detection using a quantum cascade laser (QCL) under external optical feedback. The design of the QCL-based diagnostic system allowed to monitor the voltage modulation at the laser terminals induced by fast dynamics in the ablation process. Real-time detection of the ablation front velocity as well as in-situ investigations of the surface temperature were provided. Experimental results on fast ablation rates per pulse correlate well with the theoretical prediction. The detection range was demonstrated to be limited only by the QCL-probe emission wavelength, which is scalable up to the THz spectral region.
Paper Details
Date Published: 13 March 2013
PDF: 6 pages
Proc. SPIE 8607, Laser Applications in Microelectronic and Optoelectronic Manufacturing (LAMOM) XVIII, 86070O (13 March 2013); doi: 10.1117/12.2001148
Published in SPIE Proceedings Vol. 8607:
Laser Applications in Microelectronic and Optoelectronic Manufacturing (LAMOM) XVIII
Xianfan Xu; Guido Hennig; Yoshiki Nakata; Stephan W. Roth, Editor(s)
PDF: 6 pages
Proc. SPIE 8607, Laser Applications in Microelectronic and Optoelectronic Manufacturing (LAMOM) XVIII, 86070O (13 March 2013); doi: 10.1117/12.2001148
Show Author Affiliations
Francesco P. Mezzapesa, CNR-IFN UOS Bari (Italy)
Univ. degli Studi e Politecnico di Bari (Italy)
Vincenzo Spagnolo, CNR-IFN UOS Bari (Italy)
Univ. degli Studi e Politecnico di Bari (Italy)
Univ. degli Studi e Politecnico di Bari (Italy)
Vincenzo Spagnolo, CNR-IFN UOS Bari (Italy)
Univ. degli Studi e Politecnico di Bari (Italy)
Antonio Ancona, CNR-IFN UOS Bari (Italy)
Gaetano Scamarcio, CNR-IFN UOS Bari (Italy)
Univ. degli Studi e Politecnico di Bari (Italy)
Gaetano Scamarcio, CNR-IFN UOS Bari (Italy)
Univ. degli Studi e Politecnico di Bari (Italy)
Published in SPIE Proceedings Vol. 8607:
Laser Applications in Microelectronic and Optoelectronic Manufacturing (LAMOM) XVIII
Xianfan Xu; Guido Hennig; Yoshiki Nakata; Stephan W. Roth, Editor(s)
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