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Proceedings Paper

Distortion characteristics and mapping in triangulation imaging systems
Author(s): Donald B.T. Kilgus; Donald J. Svetkoff
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Paper Abstract

Tools are now available for measurement imaging system designers to model optical distortion thoroughly and reduce it through design choices. In the case of modern automated systems, however, it is frequently more feasible to calibrate out the non-linearities and perform a real- time error correction operation. This paper presents, for the case of triangulation line scan or line-of-light imagers, some design trade-offs affecting distortion and general measurement linearity and analyzes the form of post-image correction method required. The 2D, cubic nature of a general distortion characteristic might typically mandate using a 2D correction value matrix, but one can exploit the inherent 1D nature of line-scan triangulation imaging in many cases to reduce the correction array to a 1D vector. Graphics of distortion simulations and empirical mappings are presented, and applicability of the analysis to several triangulation implementations is discussed.

Paper Details

Date Published: 6 January 1994
PDF: 9 pages
Proc. SPIE 2348, Imaging and Illumination for Metrology and Inspection, (6 January 1994); doi: 10.1117/12.198835
Show Author Affiliations
Donald B.T. Kilgus, View Engineering, Inc. (United States)
Donald J. Svetkoff, View Engineering, Inc. (United States)

Published in SPIE Proceedings Vol. 2348:
Imaging and Illumination for Metrology and Inspection
Donald J. Svetkoff, Editor(s)

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