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Proceedings Paper

Cloud optical thickness retrieval from POLDER measurements during ASTEX
Author(s): Frederic Parol; Jacques Descloitres; Claudine Vanbauce; Jean-Claude Buriez
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Paper Abstract

POLDER is a new instrument devoted to the global observation of the polarization and directionality of solar radiation reflected by the Earth surface-atmosphere system. The original capabilities of POLDER, compared to previous current radiometers are, (1) its polarized reflectance measurements in the visible and near-infrared part of the solar spectrum, (2) its capability to measure a surface target reflectance from about ten directions during a single pass. The instrument concept has been accepted on the Japanese ADEOS platform scheduled to be launched early 1996. One of the scientific objectives defined for the POLDER satellite mission concerns the cloud characteristics. The main parameter that influences the cloud radiative properties if the optical thickness. The usual method which allows to retrieve this parameter is based on the plane-parallel approximation. It is here tested on data acquired by the airborne version of POLDER during the ASTEX (Atlantic Stratocumulus Transition EXperiment) campaign. Two cloud models are considered: the homogeneous plane-parallel model and on the other hand, a horizontally heterogeneous plane-parallel model. Bidirectional Reflectance Distribution Functions derived from these two models are compared with POLDER measurements obtained for a stratocumulus cloud situation.

Paper Details

Date Published: 4 January 1995
PDF: 11 pages
Proc. SPIE 2311, Atmospheric Sensing and Modelling, (4 January 1995); doi: 10.1117/12.198589
Show Author Affiliations
Frederic Parol, Univ. des Sciences et Technologies de Lille (France)
Jacques Descloitres, Univ. des Sciences et Technologies de Lille (France)
Claudine Vanbauce, Univ. des Sciences et Technologies de Lille (France)
Jean-Claude Buriez, Univ. des Sciences et Technologies de Lille (France)

Published in SPIE Proceedings Vol. 2311:
Atmospheric Sensing and Modelling
Richard P. Santer, Editor(s)

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