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Proceedings Paper

In-plane electronic speckle pattern shearing interferometry: a theoretical analysis supported with experimental results
Author(s): Jon N. Petzing; John Raymond Tyrer
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Paper Abstract

An analysis of the out-of-plane shearing interferometer has been performed which shows that production of in-plane strain partial derivatives, which are not affected by out-of-plane displacement function components, is possible. The in-plane data is represented as substraction correlation fringes and can be formed using two designs of interferometer. One interferometer employs a single diverging illumination beam and is applicable to object plane stress and plane strain loading conditions, while the second design uses two illumination wavefronts and is suitable for the analysis of tri-axial strain conditions. These interferometers are tested and compared using a compact tension crack specimen and the results are correlated with Finite Element software predictions of strain distributions across modeled specimens.

Paper Details

Date Published: 30 November 1994
PDF: 10 pages
Proc. SPIE 2342, Interferometry '94: Photomechanics, (30 November 1994); doi: 10.1117/12.195510
Show Author Affiliations
Jon N. Petzing, Loughborough Univ. of Technology (United Kingdom)
John Raymond Tyrer, Loughborough Univ. of Technology (United Kingdom)

Published in SPIE Proceedings Vol. 2342:
Interferometry '94: Photomechanics
Ryszard J. Pryputniewicz; Jacek Stupnicki, Editor(s)

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