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Proceedings Paper

Computer-controlled high accuracy optical measurement
Author(s): Michael Schulz
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Paper Abstract

In measurements which are influenced by external parameters, computer control and automation can help to improve the accuracy. This is also true of basically optical measurement set-ups such as certain interferometers for measuring flatness or wavefront aberrations, or set-ups for measuring the optical transfer function of lenses, for example. For the latter, a critical external parameter is the temperature variation resulting in expansion and therefore defocusing effects. New developments and measurement principles leading to improved accuracy are discussed.

Paper Details

Date Published: 15 November 1994
PDF: 10 pages
Proc. SPIE 2248, Optical Measurements and Sensors for the Process Industries, (15 November 1994); doi: 10.1117/12.194341
Show Author Affiliations
Michael Schulz, Physikalisch-Technische Bundesanstalt (Germany)


Published in SPIE Proceedings Vol. 2248:
Optical Measurements and Sensors for the Process Industries
Christophe Gorecki; Richard W. T. Preater, Editor(s)

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