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Proceedings Paper

Development, fabrication, and metrology of the electro-optical breadboard model for the reflection grating array of the XMM Grating Spectrometer
Author(s): Todd A. Decker; Richard C. Montesanti; Jay V. Bixler; Charles J. Hailey; Steven M. Kahn
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Paper Abstract

A prototype array consisting of eight diffraction gratings has been fabricated for the XMM Reflection Grating Spectrometer. A component of the full spectrometer is an array of approximately 200 diffraction gratings. The diffraction gratings were produced using lightweight silicon carbide substrates and a replication technique. The prototype array was developed and assembled using the same tolerances as the flight arrays which have typical tolerances of 3 micrometers in translation and sub-arc seconds in rotation. The metrology applied during inspection and assembly included precision linear measurements, full aperture figure measurements, and angular interferometry.

Paper Details

Date Published: 7 November 1994
PDF: 11 pages
Proc. SPIE 2283, X-Ray and Ultraviolet Spectroscopy and Polarimetry, (7 November 1994); doi: 10.1117/12.193208
Show Author Affiliations
Todd A. Decker, Lawrence Livermore National Lab. (United States)
Richard C. Montesanti, Lawrence Livermore National Lab. (United States)
Jay V. Bixler, Lawrence Livermore National Lab. (United States)
Charles J. Hailey, Lawrence Livermore National Lab. (United States)
Steven M. Kahn, Lawrence Livermore National Lab. and Univ. of California/Berkeley (United States)

Published in SPIE Proceedings Vol. 2283:
X-Ray and Ultraviolet Spectroscopy and Polarimetry
Silvano Fineschi, Editor(s)

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