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Proceedings Paper

Tolerance analysis of the Far Ultraviolet Spectroscopic Explorer (FUSE): a statistical approach
Author(s): Erik Wilkinson; James C. Green; David J. Sahnow
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Paper Abstract

We present a new statistical technique for evaluating the error budget of an optical system. Each parameter evaluated in the error budget is assigned a standard deviation. Randomly generated, Gaussian distributed offsets are then generated for each parameter. The optical system is raytraced a large number of times using the offsets to simulate alignment errors. In this way it is straightforward to simultaneously evaluate the degradation in the optical performance introduced by random misalignments and fabrication errors. The error budget for a system is then defined in terms of the standard deviations assigned to each parameter under consideration.

Paper Details

Date Published: 7 November 1994
PDF: 4 pages
Proc. SPIE 2283, X-Ray and Ultraviolet Spectroscopy and Polarimetry, (7 November 1994);
Show Author Affiliations
Erik Wilkinson, Univ. of Colorado/Boulder (United States)
James C. Green, Univ. of Colorado/Boulder (United States)
David J. Sahnow, Johns Hopkins Univ. (United States)


Published in SPIE Proceedings Vol. 2283:
X-Ray and Ultraviolet Spectroscopy and Polarimetry
Silvano Fineschi, Editor(s)

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