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Proceedings Paper

Measuring reflected x-ray absorption fine structure in gold-coated x-ray mirrors
Author(s): Alan Owens; Sue C. Bayliss; S. Gurman; George W. Fraser; D. Hutt; Kieran J. McCarthy; Alan A. Wells
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Paper Abstract

We describe an experiment to quantify reflected X-ray Absorption Fine Structure (XAFS) in the mirrors to be used on the Joint European X-ray Telescope (JET-X). This instrument is due to be launched on the Russian Spectrum-X platform into deep orbit in December 1995. As part of the calibration program, samples of the Wolter type I, X-ray mirrors were taken to the Synchrotron Radiation Source at the Daresbury Laboratory and exposed to monochromatic X- rays across the energy range of the gold MI - MV edges (2 keV to 3.5 keV). We outline our research program and present preliminary results of both direct and reflected XAFS measurements at a variety of incident angles. We find that, while the position of the MII edge occurs within 3 eV of its tabulated value, the MI, MIII, MIV and MV edges are shifted to higher energies by approximately 10 eV, 13 eV, 40 eV and 40 eV, respectively. We attribute these discrepancies to inaccuracies in the field equations used to generate atomic and nuclear data tables.

Paper Details

Date Published: 11 November 1994
PDF: 7 pages
Proc. SPIE 2279, Advances in Multilayer and Grazing Incidence X-Ray/EUV/FUV Optics, (11 November 1994); doi: 10.1117/12.193151
Show Author Affiliations
Alan Owens, Univ. of Leicester (United Kingdom)
Sue C. Bayliss, DeMontfort Univ. (United Kingdom)
S. Gurman, Univ. of Leicester (United Kingdom)
George W. Fraser, Univ. of Leicester (United Kingdom)
D. Hutt, DeMontfort Univ. (United Kingdom)
Kieran J. McCarthy, Association EURATOM/CIEMAT paraFusion (United Kingdom)
Alan A. Wells, Univ. of Leicester (United Kingdom)

Published in SPIE Proceedings Vol. 2279:
Advances in Multilayer and Grazing Incidence X-Ray/EUV/FUV Optics
Richard B. Hoover; Arthur B. C. Walker Jr., Editor(s)

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