Share Email Print

Proceedings Paper

Grazing incidence mirror for a new microspectroscope using soft x-ray undulator radiation
Author(s): Markus R. Weiss; V. Wuestenhagen; E. Umbach
Format Member Price Non-Member Price
PDF $17.00 $21.00

Paper Abstract

The paper describes a concept to improve the present photon-induced scanning Auger- microscope, a high-flux micro-spectroscope which allows electron spectroscopy with high spatial resolution, in-situ chemical mapping, and microstructuring of organic and organometallic compounds. It utilizes high-brightness, quasi-monochromatic undulator radiation from BESSY storage ring. The present electron energy resolution (>= 0.5 eV) appears sufficient but the spatial resolution (>= 3 micrometers ) can be significantly improved. The new concept compromises grazing incidence optics in a two stage reduction scheme in order to combine an increase of photon flux with an increase of the spatial resolution to 0.2 micrometers . The key component of the improved instrument is an ellipsoidal grazing incidence mirror for which optimization calculations have been performed. These include diffraction, surface roughness and slope errors as well as manufactural limitations taking technical realizability into account.

Paper Details

Date Published: 11 November 1994
PDF: 10 pages
Proc. SPIE 2279, Advances in Multilayer and Grazing Incidence X-Ray/EUV/FUV Optics, (11 November 1994); doi: 10.1117/12.193127
Show Author Affiliations
Markus R. Weiss, Univ. Wuerzburg and Univ. Stuttgart (Germany)
V. Wuestenhagen, Univ. Wuerzburg and Univ. Stuttgart (Germany)
E. Umbach, Univ. Wuerzburg and Univ. Stuttgart (Germany)

Published in SPIE Proceedings Vol. 2279:
Advances in Multilayer and Grazing Incidence X-Ray/EUV/FUV Optics
Richard B. Hoover; Arthur B. C. Walker Jr., Editor(s)

© SPIE. Terms of Use
Back to Top
Sign in to read the full article
Create a free SPIE account to get access to
premium articles and original research
Forgot your username?