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Proceedings Paper

Optical observations of close binaries with the Mark III Stellar Interferometer
Author(s): Xiaopei Pan; Michael Shao; M. Mark Colavita; J. Thomas Armstrong; David Mozurkewich; Richard S. Simon; C. Denisson; Maddali Vivekanand; Kenneth J. Johnston
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Paper Abstract

For the first time, four spectroscopic binaries have been directly resolved with the Mark III Stellar Interferometer. Observations in 1988 and 1989 were analyzed, and visual orbits for four binaries have been determined. The semimajor axes for Beta Tri, Alpha Equ, Alpha And and Beta Ari are approximately 0.008 arcsec, 0.012 arcsec, 0.024 arcsec and 0.037 arcsec, respectively. The magnitude differences between two components are 0.5, 0.7, 1.8 and 2.6 mag, respectively. All of the orbital elements for Alpha And and Beta Ari were determined from interferometric data only, and agree well with spectroscopic observations. Predictions of relative position between the two components for these binaries are consistent with the measurements to less than 0.001 arcsec. Combined with data from spectroscopy, masses and distance for the double-lined spectroscopic binary Beta Ari are derived, and the results indicate that both components of Beta Ari agree well with the empirical mass-luminosity relation.

Paper Details

Date Published: 1 August 1990
PDF: 15 pages
Proc. SPIE 1237, Amplitude and Intensity Spatial Interferometry, (1 August 1990); doi: 10.1117/12.19303
Show Author Affiliations
Xiaopei Pan, California Institute of Technology (United States)
Michael Shao, Jet Propulsion Lab. (United States)
M. Mark Colavita, Jet Propulsion Lab. (United States)
J. Thomas Armstrong, Naval Research Lab. (United States)
David Mozurkewich, Naval Research Lab. (United States)
Richard S. Simon, Naval Research Lab. (United States)
C. Denisson, Naval Research Lab. (United States)
Maddali Vivekanand, Naval Research Lab. (United States)
Kenneth J. Johnston, Naval Research Lab. (United States)

Published in SPIE Proceedings Vol. 1237:
Amplitude and Intensity Spatial Interferometry
James B. Breckinridge, Editor(s)

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