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Proceedings Paper

Antireflection coatings on 1.55 um LiNbO3 guided-wave devices using sputtered SiO2/Y2O3 and SiO2/TiO2 bilayers
Author(s): C. Ramus; F. Huet; Jean Saulnier
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Paper Abstract

Two anti-reflection coatings processes, based on RF magnetron sputtering, have been used to reduce the reflectance of Ti:LiNbO3 optical waveguide/fiber interface. Measurements show typical reflectance values around -25 dB and -30 dB, at 1.55 micrometers , using respectively SiO2/Y2O3 and SiO2/TiO2 bilayers.

Paper Details

Date Published: 4 November 1994
PDF: 10 pages
Proc. SPIE 2253, Optical Interference Coatings, (4 November 1994); doi: 10.1117/12.192165
Show Author Affiliations
C. Ramus, France Telecom (Germany)
F. Huet, France Telecom (France)
Jean Saulnier, France Telecom (France)

Published in SPIE Proceedings Vol. 2253:
Optical Interference Coatings
Florin Abeles, Editor(s)

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