Proceedings Paper
Characterization of statistically rough surfaces of thin deposits by an autoregressive process| Format | Member Price | Non-Member Price |
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Paper Abstract
It is shown that rough surfaces of silver, magnesium and iron thin deposits may be accurately described by an autoregressive process. The autoregressive parameters are determined by using either the Yule-Walker or the Burg techniques and the advantages of describing statistically rough surfaces of thin deposits by linear models instead of the traditional autocovariance function, or the spectrum, is discussed.
Paper Details
Date Published: 4 November 1994
PDF: 12 pages
Proc. SPIE 2253, Optical Interference Coatings, (4 November 1994); doi: 10.1117/12.192147
Published in SPIE Proceedings Vol. 2253:
Optical Interference Coatings
Florin Abeles, Editor(s)
PDF: 12 pages
Proc. SPIE 2253, Optical Interference Coatings, (4 November 1994); doi: 10.1117/12.192147
Show Author Affiliations
M. Lafraxo, Dept. de Physique des Interactions Photons-Matiere (France)
Monique Rasigni, Dept. de Physique des Interactions Photons-Matiere (France)
F. Abdellani, Dept. de Physique des Interactions Photons-Matiere (France)
Monique Rasigni, Dept. de Physique des Interactions Photons-Matiere (France)
F. Abdellani, Dept. de Physique des Interactions Photons-Matiere (France)
Veronique Buat, Dept. de Physique des Interactions Photons-Matiere (France)
Georges Rasigni, Dept. de Physique des Interactions Photons-Matiere (France)
Antoine Llebaria, Lab. d'Astronomie Spatiale (France)
Georges Rasigni, Dept. de Physique des Interactions Photons-Matiere (France)
Antoine Llebaria, Lab. d'Astronomie Spatiale (France)
Published in SPIE Proceedings Vol. 2253:
Optical Interference Coatings
Florin Abeles, Editor(s)
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