Share Email Print

Proceedings Paper

Optical and structural properties of YF3 thin films prepared by ion-assisted deposition or ion-beam sputtering techniques
Author(s): Jean-Yves Robic; Viviane Muffato; Patrick Chaton; Michel Ida; M. Berger
Format Member Price Non-Member Price
PDF $17.00 $21.00

Paper Abstract

The properties of materials in thin films are strongly dependent on the coating techniques and on the technological parameters. We have investigated about some optical and structural properties of YF3 thin films prepared using different energetic techniques: ion assisted deposition (IAD) and ion beam sputtering (IBS). The properties of the thin films obtained by these energetic processes are compared to the properties obtained by classical electron beam evaporation. In classical evaporation, the optical properties in the visible range depend on the temperature of the deposition and on the incidence of the vapor flux. The optical properties are correlated with the density of the films measured by Rutherford backscattering. In the case of IAD, the influence on optical properties, both in the visible and in the infrared range, of some technological parameters (pressure, ion energy and ion density) are illustrated. The refractive index and the extinction coefficient have been obtained by spectrophotometry. Furthermore, we show that IBS may lead to YF3 layers of high density.

Paper Details

Date Published: 4 November 1994
PDF: 13 pages
Proc. SPIE 2253, Optical Interference Coatings, (4 November 1994); doi: 10.1117/12.192090
Show Author Affiliations
Jean-Yves Robic, CEA/LETI/DOPT (France)
Viviane Muffato, CEA/LETI/DOPT (France)
Patrick Chaton, CEA/LETI/DOPT (France)
Michel Ida, CEA/LETI/DOPT (France)
M. Berger, CEA/LETI/DOPT (France)

Published in SPIE Proceedings Vol. 2253:
Optical Interference Coatings
Florin Abeles, Editor(s)

© SPIE. Terms of Use
Back to Top
Sign in to read the full article
Create a free SPIE account to get access to
premium articles and original research
Forgot your username?