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Proceedings Paper

Computer modeling of optical thin film deposition
Author(s): Ian J. Hodgkinson; John R. Gee
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Paper Abstract

Microstructural and optical properties of obliquely deposited thin films are simulated in a computer 3D method. Identical hard sphere particles arrive serially as the simulation proceeds and relax into the nearest site where they touch the particle of impact and two others. Structural and optical properties are calculated from the resulting 3D array of particles. Peaks in the radial distribution function of simulated films are in agreement with particle to particle distances in small clusters and indicate that the films are amorphous. Columnar directions are identified by a maximum in the variance of the film density and results are given for several deposition geometries. Form birefringence is indicated by anisotropy in the 2D angular distribution function viewed down the columns, and values of the three principal refractive indices are computed by an iterative method.

Paper Details

Date Published: 4 November 1994
PDF: 12 pages
Proc. SPIE 2253, Optical Interference Coatings, (4 November 1994); doi: 10.1117/12.192061
Show Author Affiliations
Ian J. Hodgkinson, Univ. of Otago (New Zealand)
John R. Gee, Analog Digital Instruments Ltd. (New Zealand)

Published in SPIE Proceedings Vol. 2253:
Optical Interference Coatings
Florin Abeles, Editor(s)

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