Share Email Print

Proceedings Paper

Development of novel W/Si materials for the single-layered attenuated phase-shifting mask
Author(s): Hideaki Mitsui; Hideki Suda; Yoichi Yamaguchi; Kenji Matsumoto; Masaru Mitsui; S. Mitsui; Yasushi Okubo
Format Member Price Non-Member Price
PDF $17.00 $21.00

Paper Abstract

A novel material system of metal W corpuscles dispersed in silicon dioxides layer (W/Si film) has been developed for the single-layered attenuated phase-shifting mask (SAttPSM) for i-line. The W/Si film has been proved to have a wide flexibility in designing the optical transmittance and the film thickness by changing the sputtering conditions such as the O2 ratio to the sputtering gas (O2 and Ar) flow rate and the RF power supplied. The W/Si shifter film are also found to have some electric conductivity, which again depends on the sputtering conditions, tough chemical durability against both hard acid and basic solutions, and sufficient adhesion to quartz substrate SAttPSM, fabricated with the W/Si film and having the thickness of 1575 angstroms and the transmittance of 6.3%, showed the phase-shifting angle of 177.9 at i-line wavelength. The depth of focus around 0.35 micrometers hole pattern was widened from 0.6 micrometers to 1.4 micrometers .

Paper Details

Date Published: 3 November 1994
PDF: 7 pages
Proc. SPIE 2254, Photomask and X-Ray Mask Technology, (3 November 1994); doi: 10.1117/12.191964
Show Author Affiliations
Hideaki Mitsui, HOYA Corp. (Japan)
Hideki Suda, HOYA Corp. (Japan)
Yoichi Yamaguchi, HOYA Corp. (Japan)
Kenji Matsumoto, HOYA Corp. (Japan)
Masaru Mitsui, HOYA Corp. (Japan)
S. Mitsui, HOYA Corp. (Japan)
Yasushi Okubo, HOYA Corp. (Japan)

Published in SPIE Proceedings Vol. 2254:
Photomask and X-Ray Mask Technology
Hideo Yoshihara, Editor(s)

© SPIE. Terms of Use
Back to Top
Sign in to read the full article
Create a free SPIE account to get access to
premium articles and original research
Forgot your username?