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Proceedings Paper

Near-field measurements of optical channel waveguide structures
Author(s): Ahn Goo Choo; Howard E. Jackson; U. Thiel; Gregory N. De Brabander; Joseph T. Boyd
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Paper Abstract

Near field scanning optical microscopy (NSOM) has been used to investigate the guided mode intensity distribution in optical channel waveguides, phase-matched directional couplers, and symmetric Y- junctions. A near field measurement of the lateral guided mode intensity profile was performed across the optical channel waveguide, and compared with model calculations. The near field guided mode intensity profiles above the waveguides were measured as a function of distance along both a directional coupler and a Y-junction, providing a near field view of the spatial evolution of optical power in these structures.

Paper Details

Date Published: 21 October 1994
PDF: 6 pages
Proc. SPIE 2291, Integrated Optics and Microstructures II, (21 October 1994); doi: 10.1117/12.190932
Show Author Affiliations
Ahn Goo Choo, Univ. of Cincinnati (United States)
Howard E. Jackson, Univ. of Cincinnati (United States)
U. Thiel, Univ. of Cincinnati (United States)
Gregory N. De Brabander, Univ. of Cincinnati (United States)
Joseph T. Boyd, Univ. of Cincinnati (United States)

Published in SPIE Proceedings Vol. 2291:
Integrated Optics and Microstructures II
Massood Tabib-Azar; Dennis L. Polla; Ka-Kha Wong, Editor(s)

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