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Proceedings Paper

Properties of epitaxial YBa2(Cu1-xZnx)3O7 thin films prepared by inverted cylindrical magnetron sputtering
Author(s): M. Ye; R. Deltour; M. Mehbod; P. H. Duvigneaud; G. Moorgat; C. De Boeck; Y. Guo; M. Poorteman; F. Cambier
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Paper Abstract

Epitaxial YBa2(Cu1-xZnx)3O7-(delta ) thin films were prepared by an inverted cylindrical magnetron sputtering technique. X-ray diffraction shows an epitaxial growth with the c axis perpendicular to the substrate surface. The surface morphology of the films was studied by scanning electron microscopy. Auger electron microscopy analysis reveals that there is a good homogeneity throughout the film thickness. The transport properties such as the resistivity and the Hall effect were studied. The critical current densities were obtained indirectly from the imaginary part of the complex AC- susceptibility, and directly from the transport measurement performed on film microbridges. Both indirect and direct measurements gave comparable results. The critical current densities are 1.6 X 107 A/cm2 and 8 X 106 A/cm2 at 77 K for the pure films deposited on SrTiO3 and MgO substrates, respectively. The epitaxy and the values of Tc and Jc of the Zn-doped films are decreased with respect to those of the undoped films. It is found that the thermally activated flux creep model gives the best agreement with the Jc values of the pure and Zn-doped films, with a decrease of the activation energy UO for the Zn-doped films.

Paper Details

Date Published: 26 October 1994
PDF: 6 pages
Proc. SPIE 2364, Second International Conference on Thin Film Physics and Applications, (26 October 1994); doi: 10.1117/12.190819
Show Author Affiliations
M. Ye, Univ. Libre de Bruxelles (Belgium)
R. Deltour, Univ. Libre de Bruxelles (Belgium)
M. Mehbod, Univ. Libre de Bruxelles (Belgium)
P. H. Duvigneaud, Univ. Libre de Bruxelles (Belgium)
G. Moorgat, C.R.I.B.C. (Belgium)
C. De Boeck, Univ. Libre de Bruxelles (Belgium)
Y. Guo, Univ. Libre de Bruxelles (Belgium)
M. Poorteman, C.R.I.B.C. (Belgium)
F. Cambier, C.R.I.B.C. (Belgium)

Published in SPIE Proceedings Vol. 2364:
Second International Conference on Thin Film Physics and Applications
Shixun Zhou; Yongling Wang; Yi-Xin Chen; Shuzheng Mao, Editor(s)

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