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Proceedings Paper

Structure quality determination of the Hg1-xCdxTe thin films
Author(s): Fuju Yu
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Paper Abstract

The study of lattice mismatch strain, composition mutation in Hg1-xCdxTe thin films, and intensive strain field which created from substrate and acrossed all epilayers was nondestructively carried out by X-ray double crystal diffraction and X-ray topography.

Paper Details

Date Published: 26 October 1994
PDF: 5 pages
Proc. SPIE 2364, Second International Conference on Thin Film Physics and Applications, (26 October 1994); doi: 10.1117/12.190730
Show Author Affiliations
Fuju Yu, Shanghai Institute of Technical Physics (China)


Published in SPIE Proceedings Vol. 2364:
Second International Conference on Thin Film Physics and Applications
Shixun Zhou; Yongling Wang; Yi-Xin Chen; Shuzheng Mao, Editor(s)

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