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Proceedings Paper

Anomaly of the electrical properties for CoMnNiO nanocrystalline thin film
Author(s): Hui Tan; Mingde Tao; Shigeng Song
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Paper Abstract

When annealed at various temperature the amorphous film of CoMnNiO deposited by R.F. Sputtering transforms into nano-crystalline and polycrystalline, and grain size increases with increasing annealing temperature and time. The study indicated that the resistivity of the nano-crystalline films is lot bigger than of the amorphous and ploycrystalline films, and the relations of material constant (B) to temperature (T) for the nano-films were peculiar. It was suspected that anomaly of the electrical properties relate to higher density of the grain boundary in the nano-film.

Paper Details

Date Published: 26 October 1994
PDF: 5 pages
Proc. SPIE 2364, Second International Conference on Thin Film Physics and Applications, (26 October 1994); doi: 10.1117/12.190729
Show Author Affiliations
Hui Tan, Xinjiang Institute of Physics (China)
Mingde Tao, Xinjiang Institute of Physics (China)
Shigeng Song, Xinjiang Institute of Physics (China)

Published in SPIE Proceedings Vol. 2364:
Second International Conference on Thin Film Physics and Applications
Shixun Zhou; Yongling Wang; Yi-Xin Chen; Shuzheng Mao, Editor(s)

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