Proceedings Paper
Phase formation in annealed Ge/Fe multilayers| Format | Member Price | Non-Member Price |
|---|---|---|
| $17.00 | $21.00 |
Paper Abstract
Ge/Fe multilayers, which were prepared by electron beam evaporation, were annealed at temperatures between 200 and 450 degree(s)C, and the formations have been investigated. It was found that the structure of the surface layer and the interior is quite different. With the results of X-ray diffraction patterns and Mossbauer spectra, the different compound phases were found at different annealing temperature.
Paper Details
Date Published: 26 October 1994
PDF: 5 pages
Proc. SPIE 2364, Second International Conference on Thin Film Physics and Applications, (26 October 1994); doi: 10.1117/12.190715
Published in SPIE Proceedings Vol. 2364:
Second International Conference on Thin Film Physics and Applications
Shixun Zhou; Yongling Wang; Yi-Xin Chen; Shuzheng Mao, Editor(s)
PDF: 5 pages
Proc. SPIE 2364, Second International Conference on Thin Film Physics and Applications, (26 October 1994); doi: 10.1117/12.190715
Show Author Affiliations
Yu-zhi Li, Univ. of Science and Technology of China (China)
Tie Li, Univ. of Science and Technology of China (China)
Zhi Mou, Univ. of Science and Technology of China (China)
Tie Li, Univ. of Science and Technology of China (China)
Zhi Mou, Univ. of Science and Technology of China (China)
Lin Chen, Univ. of Science and Technology of China (China)
Cunyi Xu, Univ. of Science and Technology of China (China)
Guien Zhou, Univ. of Science and Technology of China (China)
Cunyi Xu, Univ. of Science and Technology of China (China)
Guien Zhou, Univ. of Science and Technology of China (China)
Published in SPIE Proceedings Vol. 2364:
Second International Conference on Thin Film Physics and Applications
Shixun Zhou; Yongling Wang; Yi-Xin Chen; Shuzheng Mao, Editor(s)
© SPIE. Terms of Use
