Share Email Print

Proceedings Paper

Midcourse Space Experiment (MSX) ion mass spectrometer: measurement of contaminant and ambient ions
Author(s): Robert E. Erlandson; Mark T. Boies; O. Manuel Uy; J. M. Grebowsky; Jack T. Coulson
Format Member Price Non-Member Price
PDF $17.00 $21.00

Paper Abstract

The Midcourse Space Experiment (MSX) ion mass spectrometer (IMS) is a Bennett radio- frequency mass spectrometer designed to measure the concentration of contaminant and ambient ionospheric ions from 1 - 60 amu. The instrument is one of a suite of six onboard contamination instruments, which also includes a neutral mass spectrometer, pressure sensor, quartz crystal microbalance, krypton water vapor monitor, and particulate flashlamp experiment. The instrument is sensitive to an incoming ion flux on the order of 1 X 107 ions/cm2s, which corresponds to an ion concentration of approximately 10 ions/cm3 for ionospheric ions that move at a speed of approximately equals 8 km/s with respect to the satellite. The IMS instrument and calibration are described in the paper. The purpose of the IMS calibration is to determine the detection efficiency for ionospheric and contaminant species that the MSX satellite is likely to encounter.

Paper Details

Date Published: 19 October 1994
PDF: 7 pages
Proc. SPIE 2261, Optical System Contamination: Effects, Measurements, and Control IV, (19 October 1994); doi: 10.1117/12.190139
Show Author Affiliations
Robert E. Erlandson, Johns Hopkins Univ. (United States)
Mark T. Boies, Johns Hopkins Univ. (United States)
O. Manuel Uy, Johns Hopkins Univ. (United States)
J. M. Grebowsky, NASA Goddard Space Flight Ctr. (United States)
Jack T. Coulson, Ideas, Inc. (United States)

Published in SPIE Proceedings Vol. 2261:
Optical System Contamination: Effects, Measurements, and Control IV
A. Peter M. Glassford, Editor(s)

© SPIE. Terms of Use
Back to Top
Sign in to read the full article
Create a free SPIE account to get access to
premium articles and original research
Forgot your username?