Share Email Print

Proceedings Paper

Optical reflectance characterization of silicon micromachined surfaces
Author(s): David M. Sowders; Victor M. Bright; Edward S. Kolesar Jr.
Format Member Price Non-Member Price
PDF $17.00 $21.00

Paper Abstract

Advanced solar cells and optical detection devices incorporate surface texturing to reduce reflection of the incident radiation and, thus, enhance optical absorption. Using micromachining techniques, three different silicon surfaces were fabricated, optically characterized, and analyzed in terms of their ability to reduce optical reflectance. The fabricated surfaces consisted of: randomly sized and spaced pyramids (RSSPs), deep vertical- wall grooves (DVWGs) and porous silicon (PS). Three regions of the optical spectrum were investigated: visible (500 - 900 nm), near-infrared (1.25 - 2.5 micrometers ), and mid-infrared (2.5 - 12.5 micrometers ). A highly-polished, single-crystal silicon wafer was used as a reference surface. The following results were experimentally determined. The RSSP surfaces decrease the reflectance by more than 69% over the entire measured spectrum. The DVWG surfaces reduce the reflectance by 85% in the visible region, 34% in the near-infrared range, and 14% over the mid-infrared wavelengths. Both thin (pore depths less than 1 micrometers ) and thick (pore depths greater than 5 micrometers ) PS surfaces were investigated. The thick PS revealed better results compared to the thin PS, demonstrating 91% reflectance reduction in the visible region, a 7% reduction in the near-infrared range, and 53% reduction over the mid-infrared wavelengths.

Paper Details

Date Published: 7 October 1994
PDF: 12 pages
Proc. SPIE 2260, Stray Radiation in Optical Systems III, (7 October 1994); doi: 10.1117/12.189216
Show Author Affiliations
David M. Sowders, Air Force Institute of Technology (United States)
Victor M. Bright, Air Force Institute of Technology (United States)
Edward S. Kolesar Jr., Texas Christian Univ. (United States)

Published in SPIE Proceedings Vol. 2260:
Stray Radiation in Optical Systems III
Robert P. Breault, Editor(s)

© SPIE. Terms of Use
Back to Top