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Proceedings Paper

Data merging for high-resolution surface profiling
Author(s): Ajit Venkataraman; Harold J. Schock; Carolyn R. Mercer
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Paper Abstract

Three dimensional surface measurements are required in a number of industrial processes. These measurements have commonly been made using contact probes, but optical sensors are now available that allow fast, non-contact measurements. A common characteristic of optical surface profilers is the trade-off between measurement accuracy and field of view. In order to measure large objects with high resolution, multiple views are required. An accurate transformation between the different views is needed to reconstruct the entire surface. We demonstrate a method of obtaining the transformation by choosing a small number of control points that lie in the overlapping region between two views. The selection of the control points is independent of the object geometry, and only an approximate knowledge of the overlapping region is required.

Paper Details

Date Published: 6 October 1994
PDF: 10 pages
Proc. SPIE 2355, Sensor Fusion VII, (6 October 1994); doi: 10.1117/12.189067
Show Author Affiliations
Ajit Venkataraman, Michigan State Univ. (United States)
Harold J. Schock, Michigan State Univ. (United States)
Carolyn R. Mercer, NASA Lewis Research Ctr. (United States)

Published in SPIE Proceedings Vol. 2355:
Sensor Fusion VII
Paul S. Schenker, Editor(s)

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