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Proceedings Paper

New method for straight line and circular arc extraction
Author(s): Daniel Crevier; Hoi J. Yoo
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Paper Abstract

We present a new method for linking edge points in a digital image, and segmenting the resulting edges into simple geometric elements. The initial linking procedure operates on the raw output of conventional edge detection algorithms, and links the pixels into sequences in a manner that guarantees the absence of branches. This linking requires no computationally expensive directional calculations to minimize branching. The resulting contours can, however, be of arbitrary length and complexity. In order to facilitate their later manipulation by higher-level algorithms, these contours are then segmented into straight line segments and circular arcs. The segmentation procedure relies on the overall symmetry of the detected segments, and avoids problems associated with the detection of corners or high curvature points. A contour segment is said to possess the considered overall symmetry property if, within certain tolerances, for any point on the segment, travelling an equal distance along the segment on each side of the point leads to contour points separated by equal straight-line chords from the central point. It appears that within the framework of digitized images, this property can only be satisfied by straight line segments and circular arcs. We describe an algorithm to extract, from arbitrary non-branching contours, segments verifying this symmetry property. After extraction, segments are classified as lines or arcs, and the radii and centers are estimated for the latter.

Paper Details

Date Published: 10 October 1994
PDF: 9 pages
Proc. SPIE 2353, Intelligent Robots and Computer Vision XIII: Algorithms and Computer Vision, (10 October 1994); doi: 10.1117/12.188888
Show Author Affiliations
Daniel Crevier, Univ. de Quebec (Canada)
Hoi J. Yoo, Univ. de Quebec (Canada)

Published in SPIE Proceedings Vol. 2353:
Intelligent Robots and Computer Vision XIII: Algorithms and Computer Vision
David P. Casasent, Editor(s)

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