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Proceedings Paper

On-line high-resolution inspection of multilayered plastic bags
Author(s): Chris C. Bowman; Olof J. Olsson; G. Terry Palmer; David W. Penman
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Paper Abstract

This paper describes the design and performance of an automated system for inspection of multilayered plastic bags recently developed at Industrial Research Limited. The system is capable of detecting and classifying sub-millimeter defects and applying grading criteria at production rates. This system will shortly be developed further for installation in a packaging manufacturing line. Unlike other plastic web inspection systems, this system was required to discriminate between two quite distinct, and optically dissimilar, types of defect. This necessitated, in particular, careful lighting design. Furthermore, the grading process is required to accommodate seams, serial numbers and other artefacts introduced by the bag manufacturing process.

Paper Details

Date Published: 3 October 1994
PDF: 8 pages
Proc. SPIE 2347, Machine Vision Applications, Architectures, and Systems Integration III, (3 October 1994); doi: 10.1117/12.188758
Show Author Affiliations
Chris C. Bowman, Industrial Research Ltd. (New Zealand)
Olof J. Olsson, Industrial Research Ltd. (New Zealand)
G. Terry Palmer, Industrial Research Ltd. (New Zealand)
David W. Penman, Industrial Research Ltd. (New Zealand)

Published in SPIE Proceedings Vol. 2347:
Machine Vision Applications, Architectures, and Systems Integration III
Bruce G. Batchelor; Susan Snell Solomon; Frederick M. Waltz, Editor(s)

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