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Proceedings Paper

Application of SKIPSM to grey-level morphology
Author(s): Frederick M. Waltz
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Paper Abstract

An overview of SKIPSM (eparated-Kemel Jinage rocessing using Finite state Machines), a powerful new way to implement many standard image processing operations, is presented in a two companion ape2 This paper describes the application of SKJPSM to grey-level morphology, which involves . in some cases, the reformulation of the grey-level morphology problem as a set of binary morphology operations, . the separation of 2-D morphological operations into a row operation followed by a column operation, . the formulation of these row and column operations in a form compatible with pipelined operation, S the implementation of the resulting operations as simple finite-state machines, and S theautomated generation of the finite-state machine configuration data. Grey-level morphology presents some difficulties to the SKJPSM paradigm having to do with word length. In spite of this, some very useful results can be obtained. Some key features of SKIPSM, as applied to grey-level morphology, are S There is a tradeoffbetween structuring element (SE) size and number of grey levels. . The SEs can be arbitrary . With currently-available components, SEa up to 5x5 and larger can be obtained. S Jfl certain special cases, SEs up to 9x9 and larger can be obtained. . Multiple SEs can be applied simultaneously in a single pipeline pass. S The user specifies the SE or SEs. All other steps can be automated. This paper includes some simple examples of the results and gives implementation feasibility guidelines based on SE size and number of grey levels. The limitations of SKIPSM in this application all relate to the capabilities of the available RAM microchips. As chip capabilities expand, larger SE sizes and greater numbers of grey levels will become feasible. KEYWORDS: image processing, separability, real time, implementations, finite-state machines, grey-level morphology

Paper Details

Date Published: 3 October 1994
PDF: 8 pages
Proc. SPIE 2347, Machine Vision Applications, Architectures, and Systems Integration III, (3 October 1994); doi: 10.1117/12.188754
Show Author Affiliations
Frederick M. Waltz, Univ. of Minnesota (United States)

Published in SPIE Proceedings Vol. 2347:
Machine Vision Applications, Architectures, and Systems Integration III
Bruce G. Batchelor; Susan Snell Solomon; Frederick M. Waltz, Editor(s)

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