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Proceedings Paper

Far ultraviolet (FUV) optical constants of unoxidized aluminum films for application to coatings of in-orbit operating optical instruments
Author(s): Juan I. Larruquert; Jose Antonio Mendez; Jose Antonio Aznarez
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Paper Abstract

The far ultraviolet (FUV) reflectance of an unoxidized thin aluminum film, prepared and maintained under UHV conditions, was measured. Reflectance versus the angle of incidence was measured in two perpendicular planes of incidence. The complex refractive index of aluminum was obtained from those reflectance measurements, taking into account the scattering induced by the surface roughness. The results here shown allow the calculation of reflectance of aluminum coatings and multilayers containing aluminum for application in FUV optical instruments operating outside the atmosphere.

Paper Details

Date Published: 30 September 1994
PDF: 11 pages
Proc. SPIE 2210, Space Optics 1994: Space Instrumentation and Spacecraft Optics, (30 September 1994); doi: 10.1117/12.188134
Show Author Affiliations
Juan I. Larruquert, CSIC (Spain)
Jose Antonio Mendez, CSIC (Spain)
Jose Antonio Aznarez, CSIC (Spain)

Published in SPIE Proceedings Vol. 2210:
Space Optics 1994: Space Instrumentation and Spacecraft Optics
Thierry M. Dewandre; Joachim J. Schulte-in-den-Baeumen; Emmanuel Sein, Editor(s)

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