Share Email Print

Proceedings Paper

Phase 1: analysis of Spectralon material for use in on-board calibration systems for the medium resolution imaging spectrometer (MERIS)
Author(s): Shelley B. Petroy; James E. Leland; Beatrice Chommeloux; Carol J. Bruegge; Georges Gourmelon
Format Member Price Non-Member Price
PDF $17.00 $21.00

Paper Abstract

Spectralon has been proposed as a material for diffuse calibration panels for several satellite-based earth-observing instruments. This paper is an interim report on the ongoing flight qualification testing of this material, including tests of the stability of the material under exposure to atomic oxygen, proton fluences, and UV/VUV radiation which match those of the polar orbit environment. No measurable degradation of optical properties were observed following atomic oxygen exposure or proton bombardment. Under initial UV/VUV exposure tests, some degradation of the optical properties of the material were observed; this optical degradation has been linked to degradation of organic contaminants. Correlative tests (Gas Chromatography/Mass Spectrometry) indicate that such contamination can be prevented by the adoption of a more rigid production protocol. It is believed that elimination of these contaminants will result in a significant improvement in the optical stability of Spectralon under UV/VUV exposure. The validation of this new production protocol will occur during a second phase of UV/VUV testing.

Paper Details

Date Published: 30 September 1994
PDF: 9 pages
Proc. SPIE 2210, Space Optics 1994: Space Instrumentation and Spacecraft Optics, (30 September 1994); doi: 10.1117/12.188121
Show Author Affiliations
Shelley B. Petroy, Labsphere, Inc. (United States)
James E. Leland, Labsphere, Inc. (United States)
Beatrice Chommeloux, Aerospatiale (France)
Carol J. Bruegge, Jet Propulsion Lab. (United States)
Georges Gourmelon, European Space Agency/ESTEC (Netherlands)

Published in SPIE Proceedings Vol. 2210:
Space Optics 1994: Space Instrumentation and Spacecraft Optics
Thierry M. Dewandre; Joachim J. Schulte-in-den-Baeumen; Emmanuel Sein, Editor(s)

© SPIE. Terms of Use
Back to Top